Consider a silicon sample doped with N_D = 1×10¹⁵/cm³ donor atoms. Assume that the intrinsic carrier concentration n_i = 1.5×10¹⁰/cm³. If the sample is additionally doped with N_A = 1×10¹⁸/cm³ acceptor atoms, the approximate number of electrons/cm³ in the sample, at T=300 K, will be _________________.

An N-type semiconductor having uniform doping is biased as shown in the figure.

If E_C is the lowest energy level of the conduction band, E_V is the highest energy level of the valance band and E_F is the Fermi level, which one of the following represents the energy band diagram for the biased N-type semiconductor?

Assume electronic charge q = 1.6×10^-19 C, kT/q = 25 mV and electron mobility μ_n = 1000 cm²/V-s. If the concentration gradient of electrons injected into a P-type silicon sample is 1×10²¹/cm⁴, the magnitude of electron diffusion current density (in A/cm²) is _________.

The silicon sample with unit cross-sectional area shown below is in thermal equilibrium. The following information is given: T=300K, electronic charge=1.6x10^{- 19}C, thermal voltage=26mV and electron mobility = 1350cm²/V-s

The magnitude of the electron drift current density at x=0.5 μm is