The dependence of drift velocity of electrons on electric field in a semiconductor is shown below. The semiconductor has a uniform electron concentration of n = 1x10¹⁶ $$cm^{-3}$$ and electronic charge q = 1.6x10^-19 C. If a bias of 5V is applied across a 1 $$\mu$$m region of this semiconductor, the resulting current density in this region, in kA/cm², is _________.

A dc voltage of 10V is applied across an n–type silicon bar having a rectangular cross–section and a length of 1cm as shown in figure. The donor doping concentration N_D and the mobility of electrons $$\mu$$n are $$10^{16}$$ cm^-3 and 1000 cm² V^-1s^-1, respectively. The average time (in $$\mu$$s) taken by the electrons to move from one end of the bar to other end is _______________.

Consider a silicon sample doped with N_D = 1×10¹⁵/cm³ donor atoms. Assume that the intrinsic carrier concentration n_i = 1.5×10¹⁰/cm³. If the sample is additionally doped with N_A = 1×10¹⁸/cm³ acceptor atoms, the approximate number of electrons/cm³ in the sample, at T=300 K, will be _________________.

An N-type semiconductor having uniform doping is biased as shown in the figure.

If E_C is the lowest energy level of the conduction band, E_V is the highest energy level of the valance band and E_F is the Fermi level, which one of the following represents the energy band diagram for the biased N-type semiconductor?