1
GATE ECE 2004
MCQ (Single Correct Answer)
+1
-0.3
Consider the following statements S1 and S2.


S1: The threshold voltage (VT) of a MOS capacitor decreases with increase in gate oxide thickness

S2: The threshold voltage (VT) of a MOS capacitor decreases with increase in substrate doping concentration.

Which one of the following is correct?
A
S1 is FALSE and S2 is TRUE
B
both S1 and S2 are TRUE
C
S1 is TRUE and S2 is FALSE
D
both S1 and S2 are FALSE
2
GATE ECE 2004
MCQ (Single Correct Answer)
+1
-0.3
The impurity commonly used for realizing the base region of a silicon n-p-n transistor is
A
Gallium
B
Indium
C
Boron
D
Phosphorus
3
GATE ECE 2004
MCQ (Single Correct Answer)
+2
-0.6
Consider the sequence of 8085 instructions given below.
LXI H, 9258
MOV A, M
CMA
MOV M, A
Which one of the following is performed by this sequence?
A
contents of location 9258 are moved to the accumulator.
B
contents of location 9258 are compared with the contents of the accumulator.
C
contents of location 9258 are complemented and stored in location 9258.
D
contents of location 5892 are complemented and stored in location 5892.
4
GATE ECE 2004
MCQ (Single Correct Answer)
+2
-0.6
It is desired to multiply the numbers 0AH by 0BH and store the result in the accumulator. The numbers are available in registers B and C respectively. A part of the 8085 program for this purpose is given below:
MVI A, 00H
LOOP:.........
...............
HLT END

The sequence of instruction to be complete the program would be

A
JNZ LOOP, ADD B, DCR C
B
ADD B, JNZ LOOP, DCR C
C
DCR C, JNZ LOOP, ADD B
D
ADD B, DCR C, JNZ LOOP
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