Consider a long rectangular bar of direct bandgap p-type semiconductor. The equilibrium hole density is 1017 cm$$-$$3 and the intrinsic carrier concentration is 1010 cm$$-$$3. Electron and hole diffusion lengthss are 2 $$\mu$$m and 1 $$\mu$$m, respectively. The left side of the bar (x = 0) is uniformly illuminated with a laser having photon energy greater than the bandgap of the semiconductor. Excess electron-hole pairs are generated ONLY at x = 0 because of the laser. The steady state electron density at x = 0 is 1014 cm$$-$$3 due to laser illumination. Under these conditions and ignoring electric field, the closest approximation (among the given options) of the steady state electron density at x = 2 $$\mu$$m, is _____________.
In a non-degenerate bulk semiconductor with electron density n = 1016 cm$$-$$3, the value of EC $$-$$ EFn = 200 meV, where EC and EFn denote the bottom of the conduction band energy and electron Fermi level energy, respectively. Assume thermal voltage as 26 meV and the intrinsic carrier concentration is 1010 cm$$-$$3. For n = 0.5 $$\times$$ 1016 cm$$-$$3, the closest approximation of the value of (EC $$-$$ EFn), among the given options is _________.
An ideal MOS capacitor (p-type semiconductor) is shown in the figure. The MOS capacitor is under strong inversion with VG = 2V. The corresponding inversion charge density (QIN) is 2.2 $$\mu$$C/cm2. Assume oxide capacitance per unit area as Cox = 1.7 $$\mu$$F/cm2. For VG = 4V, the value of QIN is __________ $$\mu$$C/cm2 (rounded off to one decimal place).
Select the CORRECT statements regarding semiconductor devices